類別  
書名  
書號  
ISBN  
作者  
出版社


Transmission Electron Microscopy and Diffractometry of Materials
書號:0750
類別:Electrical Engineering & Computer Sciences
ISBN:9783540738855
作者:Brent Fultz & James M. Howe
版次:3
裝訂:精裝
出版商:Springer
出版年份:2008年
定價(NTD) :1,700
售價(NTD) :1,700

1 Diffraction and the X-Ray Powder Diffractometer
2 The TEM and its Optics
3 Scattering
4 Inelastic Electron Scattering and Spectroscopy
5 Diffraction from Crystals
6 Electron Diffraction and Crystallography
7 Diffraction Contrast in TEM Images
8 Diffraction Lineshapes
9 Patterson Functions and Diffuse Scattering
10 High-Resolution TEM Imaging
11 High-Resolution STEM Imaging
12 Dynamical Theory

Bibliography
Appendix
Index